Research Article Open Access

SURFACE MORPHOLOGY AND STRUCTURAL PROPERTIES OF ZNS AND ZNS:AL THIN FILMS

Abstract

Un doped and doped with Al ZnS thin Films have been fabricated by vacuum evaporation technique under the vacuum of 10-5 Torr on glass substrate at room temperature and with different ratio of Al concentration of thickness (0.8μm). Structure of these films was characterized by X-ray diffraction and Atomic force microscope. The structures of these films grown on glass substrate are in cubic zinc-blende phase and textured along (111) plane. The crystallite size increases from 68.02 to 215.8 nm as the Al concentration increased from pure to 2% Al. The grain size is increase with increasing of Al concentration the surface roughness of the films is decrease with increasing of Al concentration

To read the full article Download Full Article | Visit Full Article