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.com

November 13-15, 2017 | Las Vegas, USA

14

th

International Conference and Exhibition on

Materials Science and Engineering

RRJOMS | Volume 5 | Issue 7 | November, 2017

Analysis and characterization of perovskite solar cells effected by film thickness of CH

3

NH

3

PbI

3-x

Cl

x

Layer

Dong Hoon Cho, Kyung Hwan Kim

and

Hyung Wook Choi

Gachon University, Korea

Introduction:

At present, the photovoltaic market is dominated by solar cells made of crystalline silicon. However, even in light of

the major decrease in the price of crystalline silicon, the high production and installation costs lead to long payback times in most

regions, decreasing the economic feasibility of widespread use. As such, there has been a concerted effort to find a cheaper alternative

to silicon solar cells.

Abstract:

Recently, a new class of hybrid organic halide perovskite was introduced as light harvesting material, showing strong

absorption in a broad region of the visible spectrum, good electron and hole conductivity, delivering also high open circuit voltages

in photovoltaic devices. The perovskite absorber was initially used as the sensitizer to replace dye molecules in the dye-sensitized solar

cell by using the liquid of iodide-based electrolyte. The solution-based device fabrication in solid-state perovskite solar cell (PSC) is

very attractive advantage of manufacturing compared with other solar cell. PSCs are consist of CH

3

NH

3

PbX

3

loaded on a mesoporous

TiO

2

layer in conjunction with the hole transporting material between the two electrodes.

The PSCs based on CH

3

NH

3

PbX

3

thin films processed by various methods show quite different device performances. High power

conversion efficiency was observed from PSCs based on high quality deposited CH

3

NH

3

PbX

3

thin films. Moderate power conversion

efficiency was observed from PSCs based on low quality solution-processed CH

3

NH

3

PbI

3

x

Cl

x

layer.

In this study, we studied the correlations between the efficiencies of PSCs and the film thicknesses of CH

3

NH

3

PbI

3−x

Cl

x

layers. We

investigate the device performance of X-ray diffraction (XRD) patterns, atomic force microscopy (AFM) and scanning electron

microscopy (SEM) images of CH

3

NH

3

PbI

3

−xClx films. The incident photocurrent conversion efficiency was measured using a solar

simulator (100 mW/cm

2

).

chw@gachon.ac.kr

Res. Rev. J Mat. Sci. 2017, 5:7

DOI: 10.4172/2321-6212-C1-012