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Volume 6

Research & Reviews: Journal of Material Sciences

Advanced Materials 2018

September 19-21, 2018

September 19-21, 2018 Tokyo, Japan

22

nd

International Conference on

Advanced Materials and Nanotechnology

Jaroslaw Serafinczuk et al., Res. Rev. J Mat. Sci. 2018, Volume 6

DOI: 10.4172/2321-6212-C4-024

Characterization of the ZrS

2

van der waals crystal using AFM and optical spectroscopy methods

Jaroslaw Serafinczuk, Magdalena Tamulewicz, Robert Kudrawiec and Teodor Gotszalk

Wroclaw University of Science and Technology, Poland

Z

rS

2

is a group IVB Transition Metal Dichalcogenides (TMD) material and one of the van der Waals crystals which can

be exfoliated to a single monolayer. This 2D material has rarely been studied but can have superior electrical properties

showing n-type transport behavior with an estimated mobility of 0.1

-1

.1 cm

2

V

-1

s

-1

. But most of these material parameters were

calculated theoretically. In this paper, we want to present our technology which allowed us to obtain single ZrS

2

monolayer and

results of the microscopic and optical characterization of obtained flakes. We used X-ray diffractometry for structure definition

of the investigated ZrS

2

bulk crystals, AFM microscopy for measurement of the exfoliated flakes topography which allowed us

to estimate the number of layers in the obtained flake and Kelvin Probe Force Microscopy (KPFM) for the work function of

surface mapping. For 20 layer thick flakes the contact potential difference was about -0.20 V and it changes with the thickness

of the sample. Optical spectroscopy methods defined ZrS

2

as a semiconductor with an indirect band gap of about 1.70 eV for

bulk crystals.

Biography

Jaroslaw Serafinczuk has completed his PhD in 2006 from Wroclaw University of Science and Technology (WRUST). He is the Head of X-ray Diffraction Laboratory

of Faculty of Microsystem Electronic and Photonics of WRUST. He has published more than 48 papers in reputed journals. His main topic of the research is

connected to the X-ray diffractometry, structural study of materials, 2D materials and their characterization using microscopic methods.

jaroslaw.serafinczuk@pwr.edu.pl